FEI Talos F200X TEM

FEI Talos F200X

The FEI Talos™ F200X is a 200 kV FEG Scanning Transmission Electron Microscope (S/TEM), which is designed for fast, precise and quantitative characterization of biological and materials samples. It combines outstanding quality in high resolution STEM and TEM imaging with advances in EDS signal detection and 3D characterization with compositional mapping. In addition, the Talos F200X is equipped with the new Ceta™ 16M camera, which combined with an embedded Piezo-enhanced stage, provides large field-of-view, drift-free imaging with high sensitivity and precise sample navigation. All detectors are silicon solid-state detectors, and can support a beam current up to 3 nA. System Hardware for Talos is STEM Tomography 4.x Data Acquisition Software. 

  • TEM and STEM imaging modes
  • Special applications such as Differential Phase Contrast (DPC)
  • X-FEG high-brightness electron source
  • Super-X EDS Detector for fast EDS acquisition, mapping and analysis (Silicon Drift Detector (SDD) technology)
  • High-Angle, Annular Dark Field detector (HAADF)
  • On-axis Bright-Field/Dark-Field STEM detector