FEI Helios FIB SEM

The FEI Helios NanoLabTM 660 DualBeamTM is a fully digital, Extreme High Resolution (XHR) Field Emission Scanning Electron Microscope (FE SEM) equipped with Focused Ion Beam (FIB) technology. It allows for fast characterization of nanometer details and analysis in 2D and 3D, very high quality thin sample preparation and flexible nanoprototyping.

The FIB SEM can be used for nanofabrication as well as 3-D reconstruction of biological structures.

More information about the FIB SEM is included with the Electron Microscopy Equipment.

 

 

---